Interface roughness scattering rate equation model of long-wavelength quantum cascade lasers

Ching Yu Chen, Yi Hsiu Chen, Claire F. Gmachl

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The consideration of interface roughness scattering in the model of quantum cascade lasers enables the optimization of long-wavelength designs and predicts a twofold reduction in threshold current of our design compared to the current designs.

Original languageEnglish (US)
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
StatePublished - Dec 16 2016
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Other

Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
CountryUnited States
CitySan Jose
Period6/5/166/10/16

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Chen, C. Y., Chen, Y. H., & Gmachl, C. F. (2016). Interface roughness scattering rate equation model of long-wavelength quantum cascade lasers. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 [7788063] (2016 Conference on Lasers and Electro-Optics, CLEO 2016). Institute of Electrical and Electronics Engineers Inc..