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Interaction-induced interlayer charge transfer in the extreme quantum limit
H. Deng
, Y. Liu
, I. Jo
,
L. N. Pfeiffer
, K. W. West
, K. W. Baldwin
,
M. Shayegan
Electrical and Computer Engineering
Princeton Materials Institute
Princeton Quantum Initiative
Research output
:
Contribution to journal
›
Article
›
peer-review
10
Scopus citations
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Keyphrases
High Field
100%
Standard Quantum Limit
100%
Interlayer Charge Transfer
100%
Charge Transfer
66%
Electron Systems
66%
Fill Factor
33%
Lowest Landau Level
33%
Energy Levels
33%
Landau Levels
33%
Strong Interaction
33%
Perpendicular Magnetic Field
33%
Intermediate Field
33%
Composite Fermions
33%
Wigner Crystal
33%
Electron-electron Interaction
33%
Two-layer
33%
Layer Density
33%
Adjacent Layers
33%
Quantum Capacitance
33%
Asymmetric Bilayer
33%
Physics
Fermion
100%
Magnetic Field
100%
Electron Scattering
100%
Engineering
Quantum Capacitance
33%