TY - JOUR
T1 - Influence of coulomb interaction of tunable shapes on the collective transport of ultradilute two-dimensional holes
AU - Huang, Jian
AU - Pfeiffer, L. N.
AU - West, K. W.
PY - 2014/1/22
Y1 - 2014/1/22
N2 - In high quality updoped GaAs field-effect transistors, the two-dimensional charge carrier concentrations can be tuned to very low values similar to the density of electrons on helium surfaces. An important interaction effect, screening of the Coulomb interaction by the gate, rises as a result of the large charge spacing comparable to the distance between the channel and the gate. Based on the results of the temperature (T) dependence of the resistivity from measuring four different samples, a power-law characteristic is found for charge densities ≤2×109 cm-2. Moreover, the exponent exhibits a universal dependence on a single dimensionless parameter, the ratio between the mean carrier separation and the distance to the metallic gate that screens the Coulomb interaction. Thus, the electronic properties are tuned through varying the shape of the interaction potential.
AB - In high quality updoped GaAs field-effect transistors, the two-dimensional charge carrier concentrations can be tuned to very low values similar to the density of electrons on helium surfaces. An important interaction effect, screening of the Coulomb interaction by the gate, rises as a result of the large charge spacing comparable to the distance between the channel and the gate. Based on the results of the temperature (T) dependence of the resistivity from measuring four different samples, a power-law characteristic is found for charge densities ≤2×109 cm-2. Moreover, the exponent exhibits a universal dependence on a single dimensionless parameter, the ratio between the mean carrier separation and the distance to the metallic gate that screens the Coulomb interaction. Thus, the electronic properties are tuned through varying the shape of the interaction potential.
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U2 - 10.1103/PhysRevLett.112.036803
DO - 10.1103/PhysRevLett.112.036803
M3 - Article
C2 - 24484159
AN - SCOPUS:84892942234
SN - 0031-9007
VL - 112
JO - Physical review letters
JF - Physical review letters
IS - 3
M1 - 036803
ER -