Incident beam shape effects on thick-film laser induced forward transfer

Nicholas Kattamis, Matthew Brown, Craig B. Arnold

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We use finite element modeling to investigate the effects of incident beam shape on stress and temperature evolution in the dynamic release layer during thick-film laser-induced forward transfer. Emphasis is on Gaussian versus donut-shaped beams.

Original languageEnglish (US)
Title of host publicationLasers and Electro-Optics/Quantum Electronics and Laser Science Conference
Subtitle of host publication2010 Laser Science to Photonic Applications, CLEO/QELS 2010
StatePublished - Oct 11 2010
EventLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010 - San Jose, CA, United States
Duration: May 16 2010May 21 2010

Publication series

NameLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

Other

OtherLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
CountryUnited States
CitySan Jose, CA
Period5/16/105/21/10

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Radiation

Fingerprint Dive into the research topics of 'Incident beam shape effects on thick-film laser induced forward transfer'. Together they form a unique fingerprint.

  • Cite this

    Kattamis, N., Brown, M., & Arnold, C. B. (2010). Incident beam shape effects on thick-film laser induced forward transfer. In Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010 [5501006] (Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010).