Improvement of the dielectric properties of Ta2O5 through substitution with Al2O3

R. J. Cava, W. F. Peck, J. J. Krajewski, G. L. Roberts, B. P. Barber, H. M. O'Bryan, P. L. Gammel

Research output: Contribution to journalArticlepeer-review

66 Scopus citations

Abstract

For bulk ceramic materials, small substitutions of Al2O3 in Ta2O5 are shown to cause a moderate enhancement of the dielectric constant. For compositions near 0.95Ta2O5-0.05Al2O3, the temperature coefficient of the dielectric constant at 20 °C dramatically decreases, from more than 200 ppm/°C for pure Ta2O5 to less than 20 ppm/°C. The quality factors (Q) at 1 MHz, are 2000-5000. Measurements to 14 GHz at 20 °C show that the dielectric constant is maintained to microwave frequencies, with a g of ∼600 at 5 GHz.

Original languageEnglish (US)
Pages (from-to)1396-1398
Number of pages3
JournalApplied Physics Letters
Volume70
Issue number11
DOIs
StatePublished - Mar 17 1997
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Improvement of the dielectric properties of Ta2O5 through substitution with Al2O3'. Together they form a unique fingerprint.

Cite this