Abstract
We apply deconvolution to light-field data acquired by light-field fluorescence microscopy with scanning Bessel-beam illumination to enhance resolution of 3D images. We demonstrate enhanced axial resolution and correction of aberration due to refractive index mismatch.
| Original language | English (US) |
|---|---|
| Article number | JTh3A.2 |
| Journal | Optics InfoBase Conference Papers |
| State | Published - 2015 |
| Event | Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2015 - Arlington, United States Duration: Jun 7 2015 → Jun 11 2015 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials