Improved Resolution of Light-field Fluorescence with Scanning Bessel Beam Illumination

Kevin T. Takasaki, Jason W. Fleischer

Research output: Contribution to journalConference articlepeer-review

Abstract

We apply deconvolution to light-field data acquired by light-field fluorescence microscopy with scanning Bessel-beam illumination to enhance resolution of 3D images. We demonstrate enhanced axial resolution and correction of aberration due to refractive index mismatch.

Original languageEnglish (US)
Article numberJTh3A.2
JournalOptics InfoBase Conference Papers
StatePublished - 2015
EventApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2015 - Arlington, United States
Duration: Jun 7 2015Jun 11 2015

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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