@inproceedings{13de7a6e261046e498ad4eb7159c38fd,
title = "Improved Resolution of Light-field Fluorescence with Scanning Bessel Beam Illumination",
abstract = "We apply deconvolution to light-field data acquired by light-field fluorescence microscopy with scanning Bessel-beam illumination to enhance resolution of 3D images. We demonstrate enhanced axial resolution and correction of aberration due to refractive index mismatch.",
author = "Takasaki, {Kevin T.} and Fleischer, {Jason W.}",
note = "Publisher Copyright: {\textcopyright} 2015 Optical Society of America.; Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2015 ; Conference date: 07-06-2015 Through 11-06-2015",
year = "2015",
language = "English (US)",
series = "Optics InfoBase Conference Papers",
publisher = "Optica Publishing Group (formerly OSA)",
booktitle = "Applied Industrial Optics",
}