Abstract
A high-throughput lithographic method with 25-nanometer resolution and smooth vertical sidewalls is proposed and demonstrated. The technique uses compression molding to create a thickness contrast pattern in a thin resist film carried on a substrate, followed by anisotropic etching to transfer the pattern through the entire resist thickness. Metal patterns with a feature size of 25 nanometers and a period of 70 nanometers were fabricated with the use of resist templates created by imprint lithography in combination with a lift-off process. With further development, imprint lithography should allow fabrication of sub-10-nanometer structures and may become a commercially viable technique for manufacturing integrated circuits and other nanodevices.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 85-87 |
| Number of pages | 3 |
| Journal | Science |
| Volume | 272 |
| Issue number | 5258 |
| DOIs | |
| State | Published - Apr 5 1996 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General
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