Imaging of layered semiconductor clusters by scanning tunneling microscopy: Bi2S3 on graphite and gold substrates

T. W. Jing, Nai Phuan Ong, C. J. Sandroff

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Abstract

We present scanning tunneling microscope images of Bi2S 3 clusters deposited on the surfaces of graphite and gold. We observed similar images on both substrates, discerning the disk-like structures expected for clusters having layered symmetry. The images of highest quality were obtained for 600-atom clusters roughly 100 Å in lateral extent and 25 Å thick. The difficulty in characterizing clusters with smaller lateral dimension suggests that clusters must be bound to the surface with a critical adsorption energy in order to obtain stable images.

Original languageEnglish (US)
Pages (from-to)104-106
Number of pages3
JournalApplied Physics Letters
Volume53
Issue number2
DOIs
StatePublished - Dec 1 1988

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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