Imaging and direct manipulation of nanoscale three-dimensional features using the noncontact atomic force microscope

T. R. Ramachandran, A. Madhukar, P. Chen, B. E. Koel

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We report on a remarkable image contrast reversal in noncontact atomic force microscope (NC-AFM) imaging of nanosized three-dimensional (3D) particles. We show that the image contrast of such 3D particles can switch from positive to negative as a function of NC-AFM imaging conditions and this occurs during, both, in situ ultrahigh vacuum imaging and imaging in air. Our results indicate that the contrast reversal can arise from a tip-sample interaction force-gradient-dependent instability of the NC-AFM feedback loop. Exploiting the above instability to induce selective tip-sample contact, we propose and demonstrate a protocol for the controlled nanomanipulation of 5 nm diameter gold particles, in air at room temperature using the NC-AFM. The contrast reversal phenomenon is proposed to be universal, suggesting its potential applicability to nanomanipulation in a variety of materials systems.

Original languageEnglish (US)
Pages (from-to)1425-1429
Number of pages5
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume16
Issue number3
DOIs
StatePublished - Dec 1 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of 'Imaging and direct manipulation of nanoscale three-dimensional features using the noncontact atomic force microscope'. Together they form a unique fingerprint.

Cite this