IIIB-6 Analysis of Current Transport and Charge Trapping in Ultrathin Nitrided Oxide MIS Capacitors

S. T. Chang, Stephen Aplin Lyon

Research output: Contribution to journalArticle

3 Scopus citations
Original languageEnglish (US)
Number of pages1
JournalIEEE Transactions on Electron Devices
Volume31
Issue number12
DOIs
StatePublished - Jan 1 1984

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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