IIB-2 Interface State Generation by Negative Gate-bias Irradiation of MOS Structures

P. U. Kenkare, S. A. Lyon

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'IIB-2 Interface State Generation by Negative Gate-bias Irradiation of MOS Structures'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds