IIA-5 Transconductance Enhancement Mechanisms in Ultra-Thin (≤ Å) Silicon-on-Insulator MOSFET's

J. C. Sturm, K. Tokunaga, J. P. Colinge

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)2431-2432
Number of pages2
JournalIEEE Transactions on Electron Devices
Volume35
Issue number12
DOIs
StatePublished - Dec 1988

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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