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Hyperuniformity in amorphous silicon based on the measurement of the infinite-wavelength limit of the structure factor
Ruobing Xie, Gabrielle G. Long, Steven J. Weigand, Simon C. Moss, Tobi Carvalho, Sjoerd Roorda, Miroslav Hejna, Salvatore Torquato, Paul J. Steinhardt
Research output: Contribution to journal › Article › peer-review
63
Scopus
citations