Hydrogen isotope trapping in materials exposed in PLT

W. R. Wampler; S. T. Picraux; S. A. Cohen; H. F. Dylla; G. M. McCracken; S. M. Rossnagel; C. W. Magee

doi:10.1016/0022-3115(79)90389-1

Hydrogen isotope trapping in materials exposed in PLT

W. R. Wampler, S. T. Picraux, S. A. Cohen, H. F. Dylla, G. M. McCracken, S. M. Rossnagel, C. W. Magee

Research output: Contribution to journal › Article › peer-review

Abstract

Samples exposed at various minor radii in PLT to small numbers of high power discharges have been analyzed for the amount and depth distribution of implanted hydrogen isotopes and higher Z impurities. Comparisons of the measured H,D concentrations and depth profiles with laboratory implantations and calculated depth profiles give the energy and fluence of the hydrogen implanted in the PLT samples. For a Maxwellian distribution, characteristic temperatures of 500 to 600eV due to plasma charge exchange, and 50 to 350eV due to ions at the plasma edge are obtained. Also a 5-40keV component is observed due to neutral beam injection.

Original language	English (US)
Pages (from-to)	983-987
Number of pages	5
Journal	Journal of Nuclear Materials
Volume	85-86
Issue number	PART 2
DOIs	https://doi.org/10.1016/0022-3115(79)90389-1
State	Published - Dec 2 1979

All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Materials Science(all)
Nuclear Energy and Engineering

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10.1016/0022-3115(79)90389-1

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title = "Hydrogen isotope trapping in materials exposed in PLT",

abstract = "Samples exposed at various minor radii in PLT to small numbers of high power discharges have been analyzed for the amount and depth distribution of implanted hydrogen isotopes and higher Z impurities. Comparisons of the measured H,D concentrations and depth profiles with laboratory implantations and calculated depth profiles give the energy and fluence of the hydrogen implanted in the PLT samples. For a Maxwellian distribution, characteristic temperatures of 500 to 600eV due to plasma charge exchange, and 50 to 350eV due to ions at the plasma edge are obtained. Also a 5-40keV component is observed due to neutral beam injection.",

author = "Wampler, {W. R.} and Picraux, {S. T.} and Cohen, {S. A.} and Dylla, {H. F.} and McCracken, {G. M.} and Rossnagel, {S. M.} and Magee, {C. W.}",

note = "Funding Information: The position of the samples of the earIier sets (3,4] was a few centimeters recessed from the outer wall, which is 50 cm from the centerline of the *This work is supported in part by the U. S. Department of Energy, DOE under Contracts AT(29-I)789 yd E4-76-C-02-3073.",

year = "1979",

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doi = "10.1016/0022-3115(79)90389-1",

language = "English (US)",

volume = "85-86",

pages = "983--987",

journal = "Journal of Nuclear Materials",

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publisher = "Elsevier",

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T1 - Hydrogen isotope trapping in materials exposed in PLT

AU - Wampler, W. R.

AU - Picraux, S. T.

AU - Cohen, S. A.

AU - Dylla, H. F.

AU - McCracken, G. M.

AU - Rossnagel, S. M.

AU - Magee, C. W.

N1 - Funding Information: The position of the samples of the earIier sets (3,4] was a few centimeters recessed from the outer wall, which is 50 cm from the centerline of the *This work is supported in part by the U. S. Department of Energy, DOE under Contracts AT(29-I)789 yd E4-76-C-02-3073.

PY - 1979/12/2

Y1 - 1979/12/2

N2 - Samples exposed at various minor radii in PLT to small numbers of high power discharges have been analyzed for the amount and depth distribution of implanted hydrogen isotopes and higher Z impurities. Comparisons of the measured H,D concentrations and depth profiles with laboratory implantations and calculated depth profiles give the energy and fluence of the hydrogen implanted in the PLT samples. For a Maxwellian distribution, characteristic temperatures of 500 to 600eV due to plasma charge exchange, and 50 to 350eV due to ions at the plasma edge are obtained. Also a 5-40keV component is observed due to neutral beam injection.

AB - Samples exposed at various minor radii in PLT to small numbers of high power discharges have been analyzed for the amount and depth distribution of implanted hydrogen isotopes and higher Z impurities. Comparisons of the measured H,D concentrations and depth profiles with laboratory implantations and calculated depth profiles give the energy and fluence of the hydrogen implanted in the PLT samples. For a Maxwellian distribution, characteristic temperatures of 500 to 600eV due to plasma charge exchange, and 50 to 350eV due to ions at the plasma edge are obtained. Also a 5-40keV component is observed due to neutral beam injection.

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JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

IS - PART 2

ER -

Hydrogen isotope trapping in materials exposed in PLT

Abstract

All Science Journal Classification (ASJC) codes

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