Hydrogen isotope trapping in materials exposed in PLT

W. R. Wampler, S. T. Picraux, S. A. Cohen, H. F. Dylla, G. M. McCracken, S. M. Rossnagel, C. W. Magee

Research output: Contribution to journalArticle

22 Scopus citations

Abstract

Samples exposed at various minor radii in PLT to small numbers of high power discharges have been analyzed for the amount and depth distribution of implanted hydrogen isotopes and higher Z impurities. Comparisons of the measured H,D concentrations and depth profiles with laboratory implantations and calculated depth profiles give the energy and fluence of the hydrogen implanted in the PLT samples. For a Maxwellian distribution, characteristic temperatures of 500 to 600eV due to plasma charge exchange, and 50 to 350eV due to ions at the plasma edge are obtained. Also a 5-40keV component is observed due to neutral beam injection.

Original languageEnglish (US)
Pages (from-to)983-987
Number of pages5
JournalJournal of Nuclear Materials
Volume85-86
Issue numberPART 2
DOIs
StatePublished - Dec 2 1979

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering

Fingerprint Dive into the research topics of 'Hydrogen isotope trapping in materials exposed in PLT'. Together they form a unique fingerprint.

  • Cite this

    Wampler, W. R., Picraux, S. T., Cohen, S. A., Dylla, H. F., McCracken, G. M., Rossnagel, S. M., & Magee, C. W. (1979). Hydrogen isotope trapping in materials exposed in PLT. Journal of Nuclear Materials, 85-86(PART 2), 983-987. https://doi.org/10.1016/0022-3115(79)90389-1