High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers

Carl D. Reintsema; Doug A. Bennett; Edward V. Denison; Malcolm Durkin; Willaim B. Doriese; Joseph W. Fowler; Johnathon D. Gard; Arpi Grigorian; Gene C. Hilton; Johannes Hubmayr; Galen C. O'Neil; John A.B. Mates; Kelsey M. Morgan; Dan R. Schmidt; Robert W. Stevens; Daniel S. Swetz; Leila R. Vale; Joel N. Ullom; Kent D. Irwin; Saptarshi Chaudhuri; Charles J. Titus; Carl S. Dawson

doi:10.1109/TASC.2019.2904594

High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers

Carl D. Reintsema, Doug A. Bennett, Edward V. Denison, Malcolm Durkin, Willaim B. Doriese, Joseph W. Fowler, Johnathon D. Gard, Arpi Grigorian, Gene C. Hilton, Johannes Hubmayr, Galen C. O'Neil, John A.B. Mates, Kelsey M. Morgan, Dan R. Schmidt, Robert W. Stevens, Daniel S. Swetz, Leila R. Vale, Joel N. Ullom, Kent D. Irwin, Saptarshi ChaudhuriCharles J. Titus, Carl S. Dawson

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The successful realization and broad deployment of transition edge sensor (TES)-based detector systems has led to significant demand for time-division and code-division superconducting quantum interference device (SQUID) multiplexers time division multiplexing (TDM) and code division multiplexing (CDM) as essential components of the cryogenic readout chain. TDM and CDM circuits are produced by the Boulder Microfabrication Facility in large quantities and in multiple varieties to meet the needs of various bolometric and calorimetric applications. In most cases, the basic functionality of these devices must be verified before they are passed along to internal or external collaborators for integration into scientific instruments. We have developed a test bed that utilizes the NIST TDM/CDM read-out electronics to make automated multiplexed measurements on sixteen devices simultaneously in a 4 K liquid-helium dip probe. The optimization of the measurement process has resulted in vastly improved throughput and enhanced data products. We present a thorough analysis of results from the application of the test process to flux-activated-switch-style multiplexers. The utility of this approach in identifying fabrication trends, yield indicators, and common failure modes will be demonstrated.

Original language	English (US)
Article number	8665919
Journal	IEEE Transactions on Applied Superconductivity
Volume	29
Issue number	5
DOIs	https://doi.org/10.1109/TASC.2019.2904594
State	Published - Aug 2019
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Keywords

Cryogenic electronics
superconducting integrated circuits
superconducting quantum interference devices (SQUIDs)

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10.1109/TASC.2019.2904594

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Reintsema, C. D., Bennett, D. A., Denison, E. V., Durkin, M., Doriese, W. B., Fowler, J. W., Gard, J. D., Grigorian, A., Hilton, G. C., Hubmayr, J., O'Neil, G. C., Mates, J. A. B., Morgan, K. M., Schmidt, D. R., Stevens, R. W., Swetz, D. S., Vale, L. R., Ullom, J. N., Irwin, K. D., ... Dawson, C. S. (2019). High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers. IEEE Transactions on Applied Superconductivity, 29(5), Article 8665919. https://doi.org/10.1109/TASC.2019.2904594

@article{52eea74316764f98a87d8d0ae08febc7,

title = "High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers",

abstract = "The successful realization and broad deployment of transition edge sensor (TES)-based detector systems has led to significant demand for time-division and code-division superconducting quantum interference device (SQUID) multiplexers time division multiplexing (TDM) and code division multiplexing (CDM) as essential components of the cryogenic readout chain. TDM and CDM circuits are produced by the Boulder Microfabrication Facility in large quantities and in multiple varieties to meet the needs of various bolometric and calorimetric applications. In most cases, the basic functionality of these devices must be verified before they are passed along to internal or external collaborators for integration into scientific instruments. We have developed a test bed that utilizes the NIST TDM/CDM read-out electronics to make automated multiplexed measurements on sixteen devices simultaneously in a 4 K liquid-helium dip probe. The optimization of the measurement process has resulted in vastly improved throughput and enhanced data products. We present a thorough analysis of results from the application of the test process to flux-activated-switch-style multiplexers. The utility of this approach in identifying fabrication trends, yield indicators, and common failure modes will be demonstrated.",

keywords = "Cryogenic electronics, superconducting integrated circuits, superconducting quantum interference devices (SQUIDs)",

author = "Reintsema, {Carl D.} and Bennett, {Doug A.} and Denison, {Edward V.} and Malcolm Durkin and Doriese, {Willaim B.} and Fowler, {Joseph W.} and Gard, {Johnathon D.} and Arpi Grigorian and Hilton, {Gene C.} and Johannes Hubmayr and O'Neil, {Galen C.} and Mates, {John A.B.} and Morgan, {Kelsey M.} and Schmidt, {Dan R.} and Stevens, {Robert W.} and Swetz, {Daniel S.} and Vale, {Leila R.} and Ullom, {Joel N.} and Irwin, {Kent D.} and Saptarshi Chaudhuri and Titus, {Charles J.} and Dawson, {Carl S.}",

note = "Publisher Copyright: {\textcopyright} 2002-2011 IEEE.",

year = "2019",

month = aug,

doi = "10.1109/TASC.2019.2904594",

language = "English (US)",

volume = "29",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

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Reintsema, CD, Bennett, DA, Denison, EV, Durkin, M, Doriese, WB, Fowler, JW, Gard, JD, Grigorian, A, Hilton, GC, Hubmayr, J, O'Neil, GC, Mates, JAB, Morgan, KM, Schmidt, DR, Stevens, RW, Swetz, DS, Vale, LR, Ullom, JN, Irwin, KD, Chaudhuri, S, Titus, CJ & Dawson, CS 2019, 'High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers', IEEE Transactions on Applied Superconductivity, vol. 29, no. 5, 8665919. https://doi.org/10.1109/TASC.2019.2904594

TY - JOUR

T1 - High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers

AU - Reintsema, Carl D.

AU - Bennett, Doug A.

AU - Denison, Edward V.

AU - Durkin, Malcolm

AU - Doriese, Willaim B.

AU - Fowler, Joseph W.

AU - Gard, Johnathon D.

AU - Grigorian, Arpi

AU - Hilton, Gene C.

AU - Hubmayr, Johannes

AU - O'Neil, Galen C.

AU - Mates, John A.B.

AU - Morgan, Kelsey M.

AU - Schmidt, Dan R.

AU - Stevens, Robert W.

AU - Swetz, Daniel S.

AU - Vale, Leila R.

AU - Ullom, Joel N.

AU - Irwin, Kent D.

AU - Chaudhuri, Saptarshi

AU - Titus, Charles J.

AU - Dawson, Carl S.

PY - 2019/8

Y1 - 2019/8

N2 - The successful realization and broad deployment of transition edge sensor (TES)-based detector systems has led to significant demand for time-division and code-division superconducting quantum interference device (SQUID) multiplexers time division multiplexing (TDM) and code division multiplexing (CDM) as essential components of the cryogenic readout chain. TDM and CDM circuits are produced by the Boulder Microfabrication Facility in large quantities and in multiple varieties to meet the needs of various bolometric and calorimetric applications. In most cases, the basic functionality of these devices must be verified before they are passed along to internal or external collaborators for integration into scientific instruments. We have developed a test bed that utilizes the NIST TDM/CDM read-out electronics to make automated multiplexed measurements on sixteen devices simultaneously in a 4 K liquid-helium dip probe. The optimization of the measurement process has resulted in vastly improved throughput and enhanced data products. We present a thorough analysis of results from the application of the test process to flux-activated-switch-style multiplexers. The utility of this approach in identifying fabrication trends, yield indicators, and common failure modes will be demonstrated.

AB - The successful realization and broad deployment of transition edge sensor (TES)-based detector systems has led to significant demand for time-division and code-division superconducting quantum interference device (SQUID) multiplexers time division multiplexing (TDM) and code division multiplexing (CDM) as essential components of the cryogenic readout chain. TDM and CDM circuits are produced by the Boulder Microfabrication Facility in large quantities and in multiple varieties to meet the needs of various bolometric and calorimetric applications. In most cases, the basic functionality of these devices must be verified before they are passed along to internal or external collaborators for integration into scientific instruments. We have developed a test bed that utilizes the NIST TDM/CDM read-out electronics to make automated multiplexed measurements on sixteen devices simultaneously in a 4 K liquid-helium dip probe. The optimization of the measurement process has resulted in vastly improved throughput and enhanced data products. We present a thorough analysis of results from the application of the test process to flux-activated-switch-style multiplexers. The utility of this approach in identifying fabrication trends, yield indicators, and common failure modes will be demonstrated.

KW - Cryogenic electronics

KW - superconducting integrated circuits

KW - superconducting quantum interference devices (SQUIDs)

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DO - 10.1109/TASC.2019.2904594

M3 - Article

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SN - 1051-8223

VL - 29

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 5

M1 - 8665919

ER -

High-Throughput, DC-Parametric Evaluation of Flux-Activated-Switch-Based TDM and CDM SQUID Multiplexers

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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