High-resolution scanning hall probe microscopy

H. D. Hallen, H. F. Hess, A. M. Chang, L. N. Pfeiffer, K. W. West, D. B. Mitzi

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


A high resolution scanning Hall probe microscope is used to spatially resolve vortices in high temperature superconducting Bi2Sr2CaCu2O8+δ crystals. We observe a partially ordered vortex lattice at several different applied magnetic fields and temperatures. At higher temperatures, a limited amount of vortex re-arrangement is observed, but most vortices remain fixed for periods long compared to the imaging time of several hours even at temperatures as high as 75°K (the superconducting transition temperature for these crystals is ∼84°K). A measure of the local magnetic penetration depth can be obtained from a fit to the surface field of several neighboring vortices, and has been measured as a function of temperature. In particular, we have measured the zero temperature penetration depth and found it to be 275 ± 40 nm.

Original languageEnglish (US)
Pages (from-to)152-157
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Jun 4 1993
Externally publishedYes
EventScanning Probe Microscopies II 1993 - Los Angeles, United States
Duration: Jan 17 1993Jan 22 1993

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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