Hierarchical test generation and design for testability methods for aspp's and ASIP's

Keyphrases

• Application-specific Processors 100%
• Area Overhead 14%
• At-speed Test 14%
• Bit-width 14%
• Circuit Description 14%
• Control Information 42%
• Controller 14%
• Design for Testability 100%
• Gate Level 14%
• Generation Time 14%
• Hierarchical Testing 100%
• High-level Fault Coverage 14%
• Microcode 100%
• Multiplexer 14%
• Order of Magnitude 14%
• Output Response 14%
• Programmable Processor 28%
• Read Only Memory 28%
• Register Transfer Level 28%
• Sequential Test 14%
• Test Case Generation 100%
• Test Case Generator 14%
• Test Design 100%
• Test Generation Technique 14%
• Testability 14%
• Testability Analysis 14%
• Testability Evaluation 14%
• Thentest 14%
• Three-order 14%

Computer Science

• Critical Path 33%
• Fault Coverage 33%
• Generation Time 33%
• Multiplexer 33%
• Output Module 33%
• Output Response 33%
• Processor Instruction 100%
• Read Only Memory 66%
• Register-Transfer Level 66%
• Test Generation 100%
• Testability Analysis 33%

Engineering

• Area Overhead 20%
• Assuming 20%
• Critical Path 20%
• Data Flow 60%
• Data Path 60%
• Multiplexer 20%
• Output Response 20%
• Primary System 40%
• Symbolics 20%
• Testability 100%