Keyphrases
Application-specific Processors
100%
Area Overhead
14%
At-speed Test
14%
Bit-width
14%
Circuit Description
14%
Control Information
42%
Controller
14%
Design for Testability
100%
Gate Level
14%
Generation Time
14%
Hierarchical Testing
100%
High-level Fault Coverage
14%
Microcode
100%
Multiplexer
14%
Order of Magnitude
14%
Output Response
14%
Programmable Processor
28%
Read Only Memory
28%
Register Transfer Level
28%
Sequential Test
14%
Test Case Generation
100%
Test Case Generator
14%
Test Design
100%
Test Generation Technique
14%
Testability
14%
Testability Analysis
14%
Testability Evaluation
14%
Thentest
14%
Three-order
14%
Computer Science
Critical Path
33%
Fault Coverage
33%
Generation Time
33%
Multiplexer
33%
Output Module
33%
Output Response
33%
Processor Instruction
100%
Read Only Memory
66%
Register-Transfer Level
66%
Test Generation
100%
Testability Analysis
33%
Engineering
Area Overhead
20%
Assuming
20%
Critical Path
20%
Data Flow
60%
Data Path
60%
Multiplexer
20%
Output Response
20%
Primary System
40%
Symbolics
20%
Testability
100%