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Hardware-assisted 3D TCAD for predictive capacitance extraction in 32nm SOI SRAMs
A. N. Bhoj
, R. V. Joshi
, S. Polonsky
, R. Kanj
, S. Saroop
, Y. Tan
,
N. K. Jha
Electrical and Computer Engineering
Princeton Language and Intelligence (PLI)
NextG
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
3
Scopus citations
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Engineering
Nodes
100%
Early Phase
100%
Test Structure
100%
Design Analysis
100%
Measurable Quantity
100%
Computer Science
Bitline
100%
Silicon Footprint
100%
Total Capacitance
100%
Wordline
100%
Keyphrases
Capacitance Variation
50%
Comprehensive Technology
50%
Wordline
50%
Body Doping
50%
Bitline Capacitance
50%
Junction Capacitance
50%
Process Layout
50%
Total Capacitance
50%
Material Science
Capacitance
100%
Silicon
16%