Hall effect of La2-xSrxCuO4: Implications for the electronic structure in the normal state

Nai Phuan Ong, Z. Z. Wang, J. Clayhold, J. M. Tarascon, L. H. Greene, W. R. McKinnon

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Abstract

The Hall effect has been measured at 77 K in La2-xSrxCuO4 for the range of x in which high-temperature superconductivity is observed. Below x=0.15 1/RH increases linearly with x consistent with one itinerant hole per Sr atom. (The carrier density is 2.1×1021 cm-3 at x=0.15 where the superconducting transition temperature is a maximum.) Between 0.15 and 0.18 RH drops by a factor of 30, remaining undetectable for larger x. Proposed charge-density-wave models are in conflict with the data.

Original languageEnglish (US)
Pages (from-to)8807-8810
Number of pages4
JournalPhysical Review B
Volume35
Issue number16
DOIs
StatePublished - Jan 1 1987

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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    Ong, N. P., Wang, Z. Z., Clayhold, J., Tarascon, J. M., Greene, L. H., & McKinnon, W. R. (1987). Hall effect of La2-xSrxCuO4: Implications for the electronic structure in the normal state. Physical Review B, 35(16), 8807-8810. https://doi.org/10.1103/PhysRevB.35.8807