Growth of an ordered crystalline organic heterojunction

Richard R. Lunt, Jay B. Benziger, Stephen R. Forrest

Research output: Contribution to journalArticle

42 Scopus citations

Abstract

The organic vapor phase deposition (OVPD) growth of both PTCDA (3,4,9,10-perylenetetracarboxylic dianhydride) and copper phthalocyanine (CuPc) thick films on an alkali halide substrate with long range crystalline order was demonstrated. Crystal structure was monitored in situ and in real-time with HP-RHEED and ex-situ with X-ray diffraction in the Bragg-Brentano configuration using a Rigaka Cu Ka rotating anode source. Film thickness was measured post-growth using a variable-angle spectroscopic ellipsometer on solvent-cleaned Si substrates. Surface topography was observed using AFM and SEM after coating the surface with 20 A of Au to prevent charging in the SEM. The d-spacings were calculated for each assigned streak location, to index the HP-RHEED patterns. It was observed that a flat surface that accompanies long range film order can be achieved at low growth temperatures on templating substrates.

Original languageEnglish (US)
Pages (from-to)4229-4233
Number of pages5
JournalAdvanced Materials
Volume19
Issue number23
DOIs
StatePublished - Dec 3 2007

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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    Lunt, R. R., Benziger, J. B., & Forrest, S. R. (2007). Growth of an ordered crystalline organic heterojunction. Advanced Materials, 19(23), 4229-4233. https://doi.org/10.1002/adma.200701572