Abstract
Algorithm-based fault tolerance (ABFT) is a technique for improving the reliability of a multiprocessor system by providing concurrent error detection and fault location capability to it. In this paper, we propose the first integrated solution to the problem of fault detection, location and graceful degradation in ABFT systems. Unlike most previous methods, we use an extended model for representing ABFT systems, which allows faults to occur in check computing processors.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 333-336 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 2 |
| State | Published - 1994 |
| Event | Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) - London, England Duration: May 30 1994 → Jun 2 1994 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering