Genesis: A behavioral synthesis system for hierarchical testability

Sandeep Bhatia, Niraj K. Jha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

42 Scopus citations

Abstract

Previous research in the area of behavioral synthesis of digital circuits has mostly concentrated on optimizing area and performance. We present a behavioral data path synthesis system, called Genesis, which is geared towards hierarchical testability. A test environment for each module in the data path is guaranteed during allocation such that it becomes possible to justify any desired test set at module inputs from system inputs, and propagate fault effects from module outputs to system outputs. Genesis provided 100% system-level testability for all the synthesized benchmarks with a three-to-four orders of magnitude improvement in test generation time as compared to an efficient gate-level sequential test generator. The area overhead of circuits synthesized by Genesis is usually zero over circuits synthesized by other behavioral synthesis systems which disregard testability. Genesis can also easily handle loop constructs in the behavioral specification.

Original languageEnglish (US)
Title of host publicationProceedings of the European Design and Test Conference
Editors Anon
PublisherPubl by IEEE
Pages272-276
Number of pages5
ISBN (Print)0818654112
StatePublished - Jan 1 1994
EventProceedings of the European Design and Test Conference - Paris, Fr
Duration: Feb 28 1994Mar 3 1994

Publication series

NameProceedings of the European Design and Test Conference

Other

OtherProceedings of the European Design and Test Conference
CityParis, Fr
Period2/28/943/3/94

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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