Generation of nanoscale anticounterfeiting patterns on silicon by optical trap assisted nanopatterning

Keyphrases

• Trap-assisted 100%
• Optical Trapping 100%
• Nanopatterning 100%
• Anti-counterfeiting 100%
• Nanoscale Features 50%
• Atomic Force Microscopy 50%
• Statistical Fluctuations 50%
• Exact Method 50%
• Three-level 50%
• Optical Microscopy 50%
• Security Marking 50%
• Secure Authentication 50%
• Security Patterns 50%
• Examination Process 50%
• Scanning Electron Microscopy (SEM-EDS) 50%

Physics

• Nanopatterning 100%
• Nanoscale 100%
• Atomic Force Microscopy 50%
• Scanning Electron Microscopy 50%
• Microscopy 50%

Material Science

• Scanning Electron Microscopy 100%
• Silicon 100%
• Atomic Force Microscopy 100%