Gamma-ray polarimetry with Compton telescope

Hiroyasu Tajima; Grzegorz Madejski; Takefumi Mitani; Takaaki Tanaka; Hidehito Nakamura; Kazuhiro Nakazawa; Tadayuki Takahashi; Yasushi Fukazawa; Tuneyoshi Kamae; Motohide Kokubun; Daniel Marlow; Masaharu Nomachi; Eduardo Do Couto e Silva

doi:10.1117/12.552487

Gamma-ray polarimetry with Compton telescope

Hiroyasu Tajima, Grzegorz Madejski, Takefumi Mitani, Takaaki Tanaka, Hidehito Nakamura, Kazuhiro Nakazawa, Tadayuki Takahashi, Yasushi Fukazawa, Tuneyoshi Kamae, Motohide Kokubun, Daniel Marlow, Masaharu Nomachi, Eduardo Do Couto e Silva

Research output: Contribution to journal › Conference article › peer-review

24 Scopus citations

Abstract

Compton telescope is a promising technology to achieve very high sensitivity in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics. Compton kinematics also enables polarization measurement which will open new windows to study gamma-ray production mechanism in the universe. CdTe and Si semiconductor technologies are key technologies to realize the Compton telescope in which their high energy resolution is crucial for high angular resolution and background rejection capability. We have assembled a prototype module using a double-sided silicon strip detector and CdTe pixel detectors. In this paper, we present expected polarization performance of a proposed mission (NeXT/SGD). We also report results from polarization measurements using polarized synchrotron light and validation of EGS4 MC simulation.

Original language	English (US)
Pages (from-to)	561-571
Number of pages	11
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5488
Issue number	PART 2
DOIs	https://doi.org/10.1117/12.552487
State	Published - 2004
Event	UV and Gamma-Ray Space Telescope Systems - Glasgow, United Kingdom Duration: Jun 21 2004 → Jun 24 2004

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Keywords

CdTe
Compton telescope
Gamma-ray
Polarimeter
Semiconductor detector
Silicon Strip Detector

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10.1117/12.552487

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title = "Gamma-ray polarimetry with Compton telescope",

abstract = "Compton telescope is a promising technology to achieve very high sensitivity in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics. Compton kinematics also enables polarization measurement which will open new windows to study gamma-ray production mechanism in the universe. CdTe and Si semiconductor technologies are key technologies to realize the Compton telescope in which their high energy resolution is crucial for high angular resolution and background rejection capability. We have assembled a prototype module using a double-sided silicon strip detector and CdTe pixel detectors. In this paper, we present expected polarization performance of a proposed mission (NeXT/SGD). We also report results from polarization measurements using polarized synchrotron light and validation of EGS4 MC simulation.",

keywords = "CdTe, Compton telescope, Gamma-ray, Polarimeter, Semiconductor detector, Silicon Strip Detector",

author = "Hiroyasu Tajima and Grzegorz Madejski and Takefumi Mitani and Takaaki Tanaka and Hidehito Nakamura and Kazuhiro Nakazawa and Tadayuki Takahashi and Yasushi Fukazawa and Tuneyoshi Kamae and Motohide Kokubun and Daniel Marlow and Masaharu Nomachi and {Do Couto e Silva}, Eduardo",

year = "2004",

doi = "10.1117/12.552487",

language = "English (US)",

volume = "5488",

pages = "561--571",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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publisher = "SPIE",

number = "PART 2",

note = "UV and Gamma-Ray Space Telescope Systems ; Conference date: 21-06-2004 Through 24-06-2004",

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TY - JOUR

T1 - Gamma-ray polarimetry with Compton telescope

AU - Tajima, Hiroyasu

AU - Madejski, Grzegorz

AU - Mitani, Takefumi

AU - Tanaka, Takaaki

AU - Nakamura, Hidehito

AU - Nakazawa, Kazuhiro

AU - Takahashi, Tadayuki

AU - Fukazawa, Yasushi

AU - Kamae, Tuneyoshi

AU - Kokubun, Motohide

AU - Marlow, Daniel

AU - Nomachi, Masaharu

AU - Do Couto e Silva, Eduardo

PY - 2004

Y1 - 2004

N2 - Compton telescope is a promising technology to achieve very high sensitivity in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics. Compton kinematics also enables polarization measurement which will open new windows to study gamma-ray production mechanism in the universe. CdTe and Si semiconductor technologies are key technologies to realize the Compton telescope in which their high energy resolution is crucial for high angular resolution and background rejection capability. We have assembled a prototype module using a double-sided silicon strip detector and CdTe pixel detectors. In this paper, we present expected polarization performance of a proposed mission (NeXT/SGD). We also report results from polarization measurements using polarized synchrotron light and validation of EGS4 MC simulation.

AB - Compton telescope is a promising technology to achieve very high sensitivity in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics. Compton kinematics also enables polarization measurement which will open new windows to study gamma-ray production mechanism in the universe. CdTe and Si semiconductor technologies are key technologies to realize the Compton telescope in which their high energy resolution is crucial for high angular resolution and background rejection capability. We have assembled a prototype module using a double-sided silicon strip detector and CdTe pixel detectors. In this paper, we present expected polarization performance of a proposed mission (NeXT/SGD). We also report results from polarization measurements using polarized synchrotron light and validation of EGS4 MC simulation.

KW - CdTe

KW - Compton telescope

KW - Gamma-ray

KW - Polarimeter

KW - Semiconductor detector

KW - Silicon Strip Detector

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U2 - 10.1117/12.552487

DO - 10.1117/12.552487

M3 - Conference article

AN - SCOPUS:10044223534

SN - 0277-786X

VL - 5488

SP - 561

EP - 571

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

IS - PART 2

T2 - UV and Gamma-Ray Space Telescope Systems

Y2 - 21 June 2004 through 24 June 2004

ER -

Gamma-ray polarimetry with Compton telescope

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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