Gamma-ray polarimetry with Compton telescope

Hiroyasu Tajima, Grzegorz Madejski, Takefumi Mitani, Takaaki Tanaka, Hidehito Nakamura, Kazuhiro Nakazawa, Tadayuki Takahashi, Yasushi Fukazawa, Tuneyoshi Kamae, Motohide Kokubun, Daniel Marlow, Masaharu Nomachi, Eduardo Do Couto e Silva

Research output: Contribution to journalConference articlepeer-review

24 Scopus citations


Compton telescope is a promising technology to achieve very high sensitivity in the soft gamma-ray band (0.1-10 MeV) by utilizing Compton kinematics. Compton kinematics also enables polarization measurement which will open new windows to study gamma-ray production mechanism in the universe. CdTe and Si semiconductor technologies are key technologies to realize the Compton telescope in which their high energy resolution is crucial for high angular resolution and background rejection capability. We have assembled a prototype module using a double-sided silicon strip detector and CdTe pixel detectors. In this paper, we present expected polarization performance of a proposed mission (NeXT/SGD). We also report results from polarization measurements using polarized synchrotron light and validation of EGS4 MC simulation.

Original languageEnglish (US)
Pages (from-to)561-571
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Issue numberPART 2
StatePublished - 2004
EventUV and Gamma-Ray Space Telescope Systems - Glasgow, United Kingdom
Duration: Jun 21 2004Jun 24 2004

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


  • CdTe
  • Compton telescope
  • Gamma-ray
  • Polarimeter
  • Semiconductor detector
  • Silicon Strip Detector


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