Fundamental beam studies of radical enhanced atomic layer deposition of TiN

Frank Greer, D. Fraser, J. W. Coburn, David B. Graves

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Fingerprint

Dive into the research topics of 'Fundamental beam studies of radical enhanced atomic layer deposition of TiN'. Together they form a unique fingerprint.

Engineering

Material Science

Keyphrases