TY - GEN
T1 - Fully integrated optical spectrometer with 500-to-830nm range in 65nm CMOS
AU - Hong, Lingyu
AU - Sengupta, Kaushik
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/3/2
Y1 - 2017/3/2
N2 - Next-generation IoT systems are expected to be enabled by compact, low-cost, low-power, smart sensing devices that provide a wealth of information to build new applications and capabilities. Among sensing modalities, optical spectrometry is one of the rapidly growing areas of interest due to its wide range of applications from environment monitoring, industrial and home applications to healthcare [1-3]. As shown in Fig. 27.8.1, current optical spectrometers are large and bulky with non-integrated components that limit their application potential. In this paper, we present a fully integrated CMOS-based optical spectrometer in a 65nm bulk process that requires no external optical components. The spectrometer achieves nearly 10nm resolution and 1.4nm accuracy in peak prediction of continuous-wave (CW) excitations between 500 and 830nm.
AB - Next-generation IoT systems are expected to be enabled by compact, low-cost, low-power, smart sensing devices that provide a wealth of information to build new applications and capabilities. Among sensing modalities, optical spectrometry is one of the rapidly growing areas of interest due to its wide range of applications from environment monitoring, industrial and home applications to healthcare [1-3]. As shown in Fig. 27.8.1, current optical spectrometers are large and bulky with non-integrated components that limit their application potential. In this paper, we present a fully integrated CMOS-based optical spectrometer in a 65nm bulk process that requires no external optical components. The spectrometer achieves nearly 10nm resolution and 1.4nm accuracy in peak prediction of continuous-wave (CW) excitations between 500 and 830nm.
UR - http://www.scopus.com/inward/record.url?scp=85016252445&partnerID=8YFLogxK
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U2 - 10.1109/ISSCC.2017.7870461
DO - 10.1109/ISSCC.2017.7870461
M3 - Conference contribution
AN - SCOPUS:85016252445
T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference
SP - 462
EP - 463
BT - 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017
A2 - Fujino, Laura C.
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 64th IEEE International Solid-State Circuits Conference, ISSCC 2017
Y2 - 5 February 2017 through 9 February 2017
ER -