Fully integrated optical spectrometer with 500-to-830nm range in 65nm CMOS

Lingyu Hong, Kaushik Sengupta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

Next-generation IoT systems are expected to be enabled by compact, low-cost, low-power, smart sensing devices that provide a wealth of information to build new applications and capabilities. Among sensing modalities, optical spectrometry is one of the rapidly growing areas of interest due to its wide range of applications from environment monitoring, industrial and home applications to healthcare [1-3]. As shown in Fig. 27.8.1, current optical spectrometers are large and bulky with non-integrated components that limit their application potential. In this paper, we present a fully integrated CMOS-based optical spectrometer in a 65nm bulk process that requires no external optical components. The spectrometer achieves nearly 10nm resolution and 1.4nm accuracy in peak prediction of continuous-wave (CW) excitations between 500 and 830nm.

Original languageEnglish (US)
Title of host publication2017 IEEE International Solid-State Circuits Conference, ISSCC 2017
EditorsLaura C. Fujino
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages462-463
Number of pages2
ISBN (Electronic)9781509037575
DOIs
StatePublished - Mar 2 2017
Event64th IEEE International Solid-State Circuits Conference, ISSCC 2017 - San Francisco, United States
Duration: Feb 5 2017Feb 9 2017

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume60
ISSN (Print)0193-6530

Other

Other64th IEEE International Solid-State Circuits Conference, ISSCC 2017
CountryUnited States
CitySan Francisco
Period2/5/172/9/17

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Hong, L., & Sengupta, K. (2017). Fully integrated optical spectrometer with 500-to-830nm range in 65nm CMOS. In L. C. Fujino (Ed.), 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017 (pp. 462-463). [7870461] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 60). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2017.7870461