Abstract
Lasing emission from scarred modes of asymmetric resonant cavity GaN microlasers was studied. The lasing modes were found to be concentrated on three bounce unstable periodic ray orbits by comparing far-field intensity patterns with images of the microlaser. The high intensity emission directions of these scarred modes were completely different from those predicted by applying Snell's law to the ray orbit. The results showed that this effect was due to the processes of Fresnel filtering which occurs when a beam of finite angular spread was incident at the critical angle for total internal reflection.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 941021-941024 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 88 |
| Issue number | 9 |
| State | Published - Mar 4 2002 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)