Foundations and Trends in Localization Technologies - Part II [Scanning the Issue]

Moe Z. Win, R. Michael Buehrer, George Chrisikos, Andrea Conti, H. Vincent Poor

Research output: Contribution to journalArticle

2 Scopus citations
Original languageEnglish (US)
Pages (from-to)1132-1135
Number of pages4
JournalProceedings of the IEEE
Volume106
Issue number7
DOIs
StatePublished - Jul 2018

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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