Focusing inside negative index materials

Jeffrey B. Brock, Andrew A. Houck, Isaac L. Chuang

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

The ray-optic simulations of negative index materials (NIM) and positive index materials (PIM), which were used to predict the features of negative index focusing, were discussed. The two-dimensional electric field measurements of the NIM slabs were performed using a scannable 2D waveguide. It was observed that the power concentration around the internal focus had a negative curvature. It was also found that the focal length of the NIM was linearly dependent on the frequency.

Original languageEnglish (US)
Pages (from-to)2472-2474
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number13
DOIs
StatePublished - Sep 27 2004
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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