The ray-optic simulations of negative index materials (NIM) and positive index materials (PIM), which were used to predict the features of negative index focusing, were discussed. The two-dimensional electric field measurements of the NIM slabs were performed using a scannable 2D waveguide. It was observed that the power concentration around the internal focus had a negative curvature. It was also found that the focal length of the NIM was linearly dependent on the frequency.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - Sep 27 2004|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)