Focusing inside negative index materials

Jeffrey B. Brock; Andrew A. Houck; Isaac L. Chuang

doi:10.1063/1.1798398

Focusing inside negative index materials

Jeffrey B. Brock, Andrew A. Houck, Isaac L. Chuang

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

The ray-optic simulations of negative index materials (NIM) and positive index materials (PIM), which were used to predict the features of negative index focusing, were discussed. The two-dimensional electric field measurements of the NIM slabs were performed using a scannable 2D waveguide. It was observed that the power concentration around the internal focus had a negative curvature. It was also found that the focal length of the NIM was linearly dependent on the frequency.

Original language	English (US)
Pages (from-to)	2472-2474
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	13
DOIs	https://doi.org/10.1063/1.1798398
State	Published - Sep 27 2004
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1798398

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@article{affa3a75eff64e63b5da1b21ddeb0942,

title = "Focusing inside negative index materials",

abstract = "The ray-optic simulations of negative index materials (NIM) and positive index materials (PIM), which were used to predict the features of negative index focusing, were discussed. The two-dimensional electric field measurements of the NIM slabs were performed using a scannable 2D waveguide. It was observed that the power concentration around the internal focus had a negative curvature. It was also found that the focal length of the NIM was linearly dependent on the frequency.",

author = "Brock, {Jeffrey B.} and Houck, {Andrew A.} and Chuang, {Isaac L.}",

note = "Funding Information: This work is funded by the NSF Center for Bits and Atoms and MURI Award No. F49620-03-1-0420. One of the authors (A. A. H.) gratefully acknowledges support from the Hertz Foundation. Copyright: Copyright 2012 Elsevier B.V., All rights reserved.",

year = "2004",

month = sep,

day = "27",

doi = "10.1063/1.1798398",

language = "English (US)",

volume = "85",

pages = "2472--2474",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "13",

}

TY - JOUR

T1 - Focusing inside negative index materials

AU - Brock, Jeffrey B.

AU - Houck, Andrew A.

AU - Chuang, Isaac L.

N1 - Funding Information: This work is funded by the NSF Center for Bits and Atoms and MURI Award No. F49620-03-1-0420. One of the authors (A. A. H.) gratefully acknowledges support from the Hertz Foundation. Copyright: Copyright 2012 Elsevier B.V., All rights reserved.

PY - 2004/9/27

Y1 - 2004/9/27

N2 - The ray-optic simulations of negative index materials (NIM) and positive index materials (PIM), which were used to predict the features of negative index focusing, were discussed. The two-dimensional electric field measurements of the NIM slabs were performed using a scannable 2D waveguide. It was observed that the power concentration around the internal focus had a negative curvature. It was also found that the focal length of the NIM was linearly dependent on the frequency.

AB - The ray-optic simulations of negative index materials (NIM) and positive index materials (PIM), which were used to predict the features of negative index focusing, were discussed. The two-dimensional electric field measurements of the NIM slabs were performed using a scannable 2D waveguide. It was observed that the power concentration around the internal focus had a negative curvature. It was also found that the focal length of the NIM was linearly dependent on the frequency.

UR - http://www.scopus.com/inward/record.url?scp=7544239427&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=7544239427&partnerID=8YFLogxK

U2 - 10.1063/1.1798398

DO - 10.1063/1.1798398

M3 - Article

AN - SCOPUS:7544239427

SN - 0003-6951

VL - 85

SP - 2472

EP - 2474

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

ER -

Focusing inside negative index materials

Abstract

All Science Journal Classification (ASJC) codes

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