Keyphrases
Temperature Variation
100%
Process Variation
100%
Fin Field-effect Transistor (FinFET)
100%
Logic Circuit
100%
Processing Temperature
100%
Voltage Variation
100%
Static Timing Analysis
60%
Leakage Power
40%
Dynamic Power
40%
Algorithm Analysis
20%
Monte Carlo Simulation
20%
Gate Delay
20%
Logic Gates
20%
Technology Node
20%
Power Analysis
20%
Quasi-Monte Carlo Simulation
20%
Bulk CMOS
20%
Operating Temperature
20%
Promising Solutions
20%
Timing Model
20%
Output Curve
20%
Average Absolute Error
20%
Output Gate
20%
Computer Science
Timing Analysis
100%
Monte Carlo Simulation
66%
Dynamic Power
66%
Process Variation
33%
Logic Gate
33%
And Gate
33%
Power Analysis
33%
Relative Performance
33%
Engineering
Logic Circuit
100%
Nodes
33%
Process Variation
33%
Relative Performance
33%
Operating Temperature
33%
And Logic Gate
33%
Average Absolute Error
33%