Field emission microscopy of ultra-nano-crystalline diamond films

O. Chubenko, S. S. Baturin, A. V. Sumant, A. V. Zinovev, K. K. Kovi, S. V. Baryshev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Nitrogen-incorporated ultrananocrystalline diamond, (N)UNCD, is an unconventional field emitter that performs in planar thin film configuration and has turn-on fields on the order of 10 V/ m. To shed more light on fundamental field emission properties of (N)UNCD, we have designed and commissioned a field emission microscope (FEM). The microscope can directly image the field emission site distribution on a cathode surface by making use of anode screens in the standard parallel plate configuration with the lateral spatial resolution 1-10 m.

Original languageEnglish (US)
Title of host publication2017 30th International Vacuum Nanoelectronics Conference, IVNC 2017
EditorsChristoph Langer, Robert Lawrowski
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages46-47
Number of pages2
ISBN (Electronic)9781509039753
DOIs
StatePublished - Sep 26 2017
Externally publishedYes
Event30th International Vacuum Nanoelectronics Conference, IVNC 2017 - Regensburg, Germany
Duration: Jul 10 2017Jul 14 2017

Publication series

Name2017 30th International Vacuum Nanoelectronics Conference, IVNC 2017

Conference

Conference30th International Vacuum Nanoelectronics Conference, IVNC 2017
Country/TerritoryGermany
CityRegensburg
Period7/10/177/14/17

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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