FIB TEM sample preparation without using lift out tools

Shiyou Xu; Gerald Poirier; Nan Yao

doi:10.1017/S1431927612005107

FIB TEM sample preparation without using lift out tools

Shiyou Xu
, Gerald Poirier
, Nan Yao

Princeton Materials Institute

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	650-651
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612005107
State	Published - Jul 2012

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927612005107

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title = "FIB TEM sample preparation without using lift out tools",

author = "Shiyou Xu and Gerald Poirier and Nan Yao",

year = "2012",

month = jul,

doi = "10.1017/S1431927612005107",

language = "English (US)",

volume = "18",

pages = "650--651",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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T1 - FIB TEM sample preparation without using lift out tools

AU - Xu, Shiyou

AU - Poirier, Gerald

AU - Yao, Nan

PY - 2012/7

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UR - https://www.scopus.com/pages/publications/85008538281#tab=citedBy

U2 - 10.1017/S1431927612005107

DO - 10.1017/S1431927612005107

M3 - Article

AN - SCOPUS:85008538281

SN - 1431-9276

VL - 18

SP - 650

EP - 651

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

FIB TEM sample preparation without using lift out tools

All Science Journal Classification (ASJC) codes

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