Fault detection in DCVS circuits

B. Vinnakota, Niraj Kumar Jha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Dynamic CMOS circuits are known to be easier to test, in general, than static CMOS circuits. Differential cascode voltage switch (DCVS) logic belongs to the dynamic CMOS logic family. No comprehensive results on deterministic testing of DCVS circuits have been presented previously. This paper discusses the detection of stuck-open, stuck-on and stuck-at faults in these circuits. A test set which detects all single stuck-on faults in the functional sections of the DCVS gates in the circuit can also be guaranteed to detect all multiple stuck-on, multiple stuck-open and unidirectional stuck-at faults in these sections, even when the faults are not confined to the functional section of a single gate. All detectable faults in the precharge, access and buffer transistors are also detected by the test set.

Original languageEnglish (US)
Title of host publicationVLSI Design 1991 - Digest of Papers - 4th CSI/IEEE International Symposium on VLSI Design
PublisherIEEE Computer Society
Pages29-34
Number of pages6
ISBN (Electronic)0818621257
DOIs
StatePublished - Jan 1 1991
Event4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991 - New Delhi, India
Duration: Jan 4 1991Jan 8 1991

Publication series

NameProceedings of the IEEE International Conference on VLSI Design
ISSN (Print)1063-9667

Conference

Conference4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991
CountryIndia
CityNew Delhi
Period1/4/911/8/91

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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