Fault detection in DCVS circuits

B. Vinnakota; N. K. Jha

doi:10.1109/ISVD.1991.185088

Fault detection in DCVS circuits

B. Vinnakota, N. K. Jha

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Dynamic CMOS circuits are known to be easier to test, in general, than static CMOS circuits. Differential cascode voltage switch (DCVS) logic belongs to the dynamic CMOS logic family. No comprehensive results on deterministic testing of DCVS circuits have been presented previously. This paper discusses the detection of stuck-open, stuck-on and stuck-at faults in these circuits. A test set which detects all single stuck-on faults in the functional sections of the DCVS gates in the circuit can also be guaranteed to detect all multiple stuck-on, multiple stuck-open and unidirectional stuck-at faults in these sections, even when the faults are not confined to the functional section of a single gate. All detectable faults in the precharge, access and buffer transistors are also detected by the test set.

Original language	English (US)
Title of host publication	VLSI Design 1991 - Digest of Papers - 4th CSI/IEEE International Symposium on VLSI Design
Publisher	IEEE Computer Society
Pages	29-34
Number of pages	6
ISBN (Electronic)	0818621257
DOIs	https://doi.org/10.1109/ISVD.1991.185088
State	Published - 1991
Event	4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991 - New Delhi, India Duration: Jan 4 1991 → Jan 8 1991

Publication series

Name	Proceedings of the IEEE International Conference on VLSI Design
ISSN (Print)	1063-9667

Conference

Conference	4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991
Country/Territory	India
City	New Delhi
Period	1/4/91 → 1/8/91

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/ISVD.1991.185088

Cite this

@inproceedings{591611edc0864c98bc308dcb675c7257,

title = "Fault detection in DCVS circuits",

abstract = "Dynamic CMOS circuits are known to be easier to test, in general, than static CMOS circuits. Differential cascode voltage switch (DCVS) logic belongs to the dynamic CMOS logic family. No comprehensive results on deterministic testing of DCVS circuits have been presented previously. This paper discusses the detection of stuck-open, stuck-on and stuck-at faults in these circuits. A test set which detects all single stuck-on faults in the functional sections of the DCVS gates in the circuit can also be guaranteed to detect all multiple stuck-on, multiple stuck-open and unidirectional stuck-at faults in these sections, even when the faults are not confined to the functional section of a single gate. All detectable faults in the precharge, access and buffer transistors are also detected by the test set.",

author = "B. Vinnakota and Jha, {N. K.}",

note = "Publisher Copyright: {\textcopyright} 1991 IEEE.; 4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991 ; Conference date: 04-01-1991 Through 08-01-1991",

year = "1991",

doi = "10.1109/ISVD.1991.185088",

language = "English (US)",

series = "Proceedings of the IEEE International Conference on VLSI Design",

publisher = "IEEE Computer Society",

pages = "29--34",

booktitle = "VLSI Design 1991 - Digest of Papers - 4th CSI/IEEE International Symposium on VLSI Design",

address = "United States",

}

Vinnakota, B & Jha, NK 1991, Fault detection in DCVS circuits. in VLSI Design 1991 - Digest of Papers - 4th CSI/IEEE International Symposium on VLSI Design., 185088, Proceedings of the IEEE International Conference on VLSI Design, IEEE Computer Society, pp. 29-34, 4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991, New Delhi, India, 1/4/91. https://doi.org/10.1109/ISVD.1991.185088

TY - GEN

T1 - Fault detection in DCVS circuits

AU - Vinnakota, B.

AU - Jha, N. K.

PY - 1991

Y1 - 1991

N2 - Dynamic CMOS circuits are known to be easier to test, in general, than static CMOS circuits. Differential cascode voltage switch (DCVS) logic belongs to the dynamic CMOS logic family. No comprehensive results on deterministic testing of DCVS circuits have been presented previously. This paper discusses the detection of stuck-open, stuck-on and stuck-at faults in these circuits. A test set which detects all single stuck-on faults in the functional sections of the DCVS gates in the circuit can also be guaranteed to detect all multiple stuck-on, multiple stuck-open and unidirectional stuck-at faults in these sections, even when the faults are not confined to the functional section of a single gate. All detectable faults in the precharge, access and buffer transistors are also detected by the test set.

AB - Dynamic CMOS circuits are known to be easier to test, in general, than static CMOS circuits. Differential cascode voltage switch (DCVS) logic belongs to the dynamic CMOS logic family. No comprehensive results on deterministic testing of DCVS circuits have been presented previously. This paper discusses the detection of stuck-open, stuck-on and stuck-at faults in these circuits. A test set which detects all single stuck-on faults in the functional sections of the DCVS gates in the circuit can also be guaranteed to detect all multiple stuck-on, multiple stuck-open and unidirectional stuck-at faults in these sections, even when the faults are not confined to the functional section of a single gate. All detectable faults in the precharge, access and buffer transistors are also detected by the test set.

UR - http://www.scopus.com/inward/record.url?scp=84909880920&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84909880920&partnerID=8YFLogxK

U2 - 10.1109/ISVD.1991.185088

DO - 10.1109/ISVD.1991.185088

M3 - Conference contribution

AN - SCOPUS:84909880920

T3 - Proceedings of the IEEE International Conference on VLSI Design

SP - 29

EP - 34

BT - VLSI Design 1991 - Digest of Papers - 4th CSI/IEEE International Symposium on VLSI Design

PB - IEEE Computer Society

T2 - 4th CSI/IEEE International Symposium on VLSI Design, VLSI 1991

Y2 - 4 January 1991 through 8 January 1991

ER -

Fault detection in DCVS circuits

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All Science Journal Classification (ASJC) codes

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