TY - GEN
T1 - Fault detection in CVS parity trees
T2 - Nineteenth International Symposium on Fault-Tolerant Computing
AU - Jha, Niraj K.
PY - 1989
Y1 - 1989
N2 - The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed (in some cases only four tests are required) for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, then the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough.
AB - The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed (in some cases only four tests are required) for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, then the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough.
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M3 - Conference contribution
AN - SCOPUS:0024897353
SN - 0818619597
T3 - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
SP - 407
EP - 414
BT - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
A2 - Anon, null
PB - Publ by IEEE
Y2 - 21 June 1989 through 23 June 1989
ER -