Fault detection in CVS parity trees: Application to SSC CVS parity and two-rail checkers

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed (in some cases only four tests are required) for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, then the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough.

Original languageEnglish (US)
Title of host publicationDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
Editors Anon
PublisherPubl by IEEE
Pages407-414
Number of pages8
ISBN (Print)0818619597
StatePublished - Dec 1 1989
EventNineteenth International Symposium on Fault-Tolerant Computing - Chicago, IL, USA
Duration: Jun 21 1989Jun 23 1989

Publication series

NameDigest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN (Print)0731-3071

Other

OtherNineteenth International Symposium on Fault-Tolerant Computing
CityChicago, IL, USA
Period6/21/896/23/89

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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  • Cite this

    Jha, N. K. (1989). Fault detection in CVS parity trees: Application to SSC CVS parity and two-rail checkers. In Anon (Ed.), Digest of Papers - FTCS (Fault-Tolerant Computing Symposium) (pp. 407-414). (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)). Publ by IEEE.