Fast test generation for circuits with RTL and gate-level views

Srivaths Ravi, Niraj K. Jha

Research output: Contribution to journal › Conference article › peer-review

17 Scopus citations

Fingerprint

Dive into the research topics of 'Fast test generation for circuits with RTL and gate-level views'. Together they form a unique fingerprint.

Computer Science

Keyphrases

Engineering

Mathematics