Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy
- Zhihao Zheng
- , Christopher S. Own
- , Adrian A. Wanner
- , Randal A. Koene
- , Eric W. Hammerschmith
- , William M. Silversmith
- , Nico Kemnitz
- , Ran Lu
- , David W. Tank
- , H. Sebastian Seung
Research output: Contribution to journal › Article › peer-review
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