The external coupling efficiency in planar organic light-emitting devices is modeled based on a quantum mechanical microvavity theory and measured by examining both the far-field emission pattern and the edge emission of light trapped in the glass substrate. The external coupling efficiency is dependent upon the thickness of the indium-tin-oxide layer and the refractive index of the substrate. The coupling efficiency ranges from ∼24% to ∼52%, but in general it is much larger than the 18.9% expected from classical ray optics.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - Mar 26 2001|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)