External coupling efficiency in planar organic light-emitting devices

M. H. Lu; J. C. Sturm

doi:10.1063/1.1357207

External coupling efficiency in planar organic light-emitting devices

M. H. Lu, J. C. Sturm

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Abstract

The external coupling efficiency in planar organic light-emitting devices is modeled based on a quantum mechanical microvavity theory and measured by examining both the far-field emission pattern and the edge emission of light trapped in the glass substrate. The external coupling efficiency is dependent upon the thickness of the indium-tin-oxide layer and the refractive index of the substrate. The coupling efficiency ranges from ∼24% to ∼52%, but in general it is much larger than the 18.9% expected from classical ray optics.

Original language	English (US)
Pages (from-to)	1927-1929
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	13
DOIs	https://doi.org/10.1063/1.1357207
State	Published - Mar 26 2001

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1357207

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@article{fc1bdb821479425ebb066dc6e88df1d5,

title = "External coupling efficiency in planar organic light-emitting devices",

abstract = "The external coupling efficiency in planar organic light-emitting devices is modeled based on a quantum mechanical microvavity theory and measured by examining both the far-field emission pattern and the edge emission of light trapped in the glass substrate. The external coupling efficiency is dependent upon the thickness of the indium-tin-oxide layer and the refractive index of the substrate. The coupling efficiency ranges from ∼24% to ∼52%, but in general it is much larger than the 18.9% expected from classical ray optics.",

author = "Lu, {M. H.} and Sturm, {J. C.}",

year = "2001",

month = mar,

day = "26",

doi = "10.1063/1.1357207",

language = "English (US)",

volume = "78",

pages = "1927--1929",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "13",

}

TY - JOUR

T1 - External coupling efficiency in planar organic light-emitting devices

AU - Lu, M. H.

AU - Sturm, J. C.

PY - 2001/3/26

Y1 - 2001/3/26

N2 - The external coupling efficiency in planar organic light-emitting devices is modeled based on a quantum mechanical microvavity theory and measured by examining both the far-field emission pattern and the edge emission of light trapped in the glass substrate. The external coupling efficiency is dependent upon the thickness of the indium-tin-oxide layer and the refractive index of the substrate. The coupling efficiency ranges from ∼24% to ∼52%, but in general it is much larger than the 18.9% expected from classical ray optics.

AB - The external coupling efficiency in planar organic light-emitting devices is modeled based on a quantum mechanical microvavity theory and measured by examining both the far-field emission pattern and the edge emission of light trapped in the glass substrate. The external coupling efficiency is dependent upon the thickness of the indium-tin-oxide layer and the refractive index of the substrate. The coupling efficiency ranges from ∼24% to ∼52%, but in general it is much larger than the 18.9% expected from classical ray optics.

UR - http://www.scopus.com/inward/record.url?scp=0035952856&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035952856&partnerID=8YFLogxK

U2 - 10.1063/1.1357207

DO - 10.1063/1.1357207

M3 - Article

AN - SCOPUS:0035952856

SN - 0003-6951

VL - 78

SP - 1927

EP - 1929

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

ER -

External coupling efficiency in planar organic light-emitting devices

Abstract

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