Exploration of the memory effect on the photon-assisted tunneling via a single quantum dot: A generalized floquet theoretical approach

Hsing Ta Chen, Tak San Ho, Shih I. Chu

Research output: Contribution to journalArticlepeer-review

Abstract

The generalized Floquet approach is developed to study memory effect on electron transport phenomena through a periodically driven single quantum dot in an electrodemulti-level dotelectrode nanoscale quantum device. The memory effect is treated using a multi-function Lorentzian spectral density (LSD) model that mimics the spectral density of each electrode in terms of multiple Lorentzian functions. For the symmetric single-function LSD model involving a single-level dot, the underlying single-particle propagator is shown to be related to a 2×2 effective time-dependent Hamiltonian that includes both the periodic external field and the electrode memory effect. By invoking the generalized Van Vleck (GVV) nearly degenerate perturbation theory, an analytical Tien-Gordon-like expression is derived for arbitrary order multi-photon resonance d.c. tunneling current. Numerically converged simulations and the GVV analytical results are in good agreement, revealing the origin of multi-photon coherent destruction of tunneling and accounting for the suppression of the staircase jumps of d.c. current due to the memory effect. Specially, a novel blockade phenomenon is observed, showing distinctive oscillations in the field-induced current in the large bias voltage limit.

Original languageEnglish (US)
Pages (from-to)2251-2270
Number of pages20
JournalInternational Journal of Modern Physics B
Volume25
Issue number17
DOIs
StatePublished - Jul 10 2011

All Science Journal Classification (ASJC) codes

  • Statistical and Nonlinear Physics
  • Condensed Matter Physics

Keywords

  • Electron transport
  • generalized Floquet theory
  • photon-assisted tunneling

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