Experimental determination of dominant scattering mechanisms in scaled InAsSb quantum well

A. Agrawal, A. Ali, R. Misra, P. E. Schiffer, B. R. Bennett, J. B. Boos, S. Datta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


Antimonide based compound semiconductors have gained considerable interest in recent years due to their superior electron and hole transport properties [1]. A Mixed anion InAsySb1-y quantum well heterostructure with high electron mobility of 13,300 cm2/Vs has already been demonstrated at a sheet carrier density of 2×1012 /cm 2, albeit for a thick EOT quantum well (QW) structure [2]. A thin EOT structure is desired for improving short channel effects while maintaining the high electron mobility in the QW. In this paper, we study the low field electron transport properties in the high mobility InAs0.8Sb0.2 quantum well as we scale the QW heterostructure. Fig. 1(a),(b) show the schematic of the thick (TQW=12nm) and scaled (TQW=7.5nm) quantum well FET structure using InAs0.8Sb0.2 as channel material, In0.2Al0.8Sb barrier layer and an ultra-thin GaSb surface layer for avoiding surface oxidation of Al in the barrier [2]. Fig. 2(a),(b) show the simulated energy band diagram of the two structures using self-consistent Schrodinger-Poisson simulation, indicating strong electron confinement in the QW. The effect of nonparabolicity on thick QW with T QW=12nm has already been studied and an effective mass (m*) of 0.043m0 has been extracted experimentally [3]. For scaled QW the subband spacing was adjusted in order to achieve electron sheet charge density as a function of temperature, and the extracted density of states m*=0.05m0 was correlated to the transport effective mass. Experimental work to verify the obtained effective mass for scaled QW is underway.

Original languageEnglish (US)
Title of host publication69th Device Research Conference, DRC 2011 - Conference Digest
Number of pages2
StatePublished - 2011
Externally publishedYes
Event69th Device Research Conference, DRC 2011 - Santa Barbara, CA, United States
Duration: Jun 20 2011Jun 22 2011

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770


Conference69th Device Research Conference, DRC 2011
Country/TerritoryUnited States
CitySanta Barbara, CA

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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