Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

A. St Amour, C. W. Liu, James Christopher Sturm, Y. Lacroix, M. L.W. Thewalt

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