Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

A. St Amour; C. W. Liu; James Christopher Sturm; Y. Lacroix; M. L.W. Thewalt

Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si_1-x-yGe_xC_y alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

A. St Amour, C. W. Liu, James Christopher Sturm, Y. Lacroix, M. L.W. Thewalt

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Number of pages	1
Journal	Applied Physics Letters
State	Published - Dec 1 1995

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Cite this

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title = "Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100){"} (Appl. Phys. Lett. (1995) 67 (3915))",

author = "Amour, {A. St} and Liu, {C. W.} and Sturm, {James Christopher} and Y. Lacroix and Thewalt, {M. L.W.}",

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T2 - Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

AU - Amour, A. St

AU - Liu, C. W.

AU - Sturm, James Christopher

AU - Lacroix, Y.

AU - Thewalt, M. L.W.

PY - 1995/12/1

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JO - Applied Physics Letters

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Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si_1-x-yGe_xC_y alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

All Science Journal Classification (ASJC) codes

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