Emissivity of rough silicon surfaces: measurement and calculations

Keyphrases

• Area Illumination 33%
• Atomic Force Microscope 33%
• Beckmann 33%
• Bidirectional Reflectance 33%
• Cone Angle 33%
• Emissivity 100%
• Illumination Source 33%
• Incident Light 33%
• Point Detector 33%
• Reflection Measurement 33%
• Silicon Surface 100%
• Silicon Wafer 33%
• Single Point 33%
• Surface Measurement 100%
• Surface Roughness Parameters 33%

Engineering

• Atomic Force Microscope 33%
• Directional 33%
• Emissivity 100%
• Experimental Observation 33%
• Light Incident 33%
• Reflectance 66%
• Roughness Parameter 33%
• Silicon Surface 100%
• Silicon Wafer 33%

Material Science

• Silicon 100%
• Silicon Wafer 100%
• Surface Roughness 100%