Elucidating the nanoscale origins of organic electronic function by conductive atomic force microscopy

Jeffrey M. Mativetsky, Yueh Lin Loo, Paolo Samorì

Research output: Contribution to journalArticle

35 Scopus citations

Abstract

Electronic and optoelectronic devices comprising organic materials are highly promising for mechanically flexible and low-cost applications. In recent years, conductive atomic force microscopy (C-AFM) has played a significant part in deciphering the nanoscopic and mesoscopic origins of organic electronic function. C-AFM is uniquely capable of measuring local electrical properties with nanoscale resolution; moreover, in conjunction with complementary atomic force microscope modes, C-AFM enables simultaneous mapping of nanoscale structure and electrical function. This feature article highlights recent progress in applying C-AFM to characterize organic electronic systems including self-assembled monolayers, graphene and related materials, organic semiconductors, and organic photovoltaic heterojunctions. This journal is

Original languageEnglish (US)
Pages (from-to)3118-3128
Number of pages11
JournalJournal of Materials Chemistry C
Volume2
Issue number17
DOIs
StatePublished - May 7 2014

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Chemistry

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