Electrostatic force microscopy of nanofibers and carbon nanotubes: Quantitative analysis using theory and experiment

Sujit Sankar Datta, Cristian Staii, Nicholas J. Pinto, Douglas R. Strachan, At Charlie Johnson

Research output: Contribution to journalConference articlepeer-review

Abstract

Electrostatic force microscopy (EFM) is a widely used scanning-probe technique for the characterization of electronic properties of nanoscale samples without the use of electrical contacts. Here we review the basic principles of EFM, developing a quantitative framework by which EFM measurements of extended nanostructures can be understood. We support our calculations with experimental data of EFM of carbon nanotubes and conducting or insulating electrospun polyaniline-based nanofibers. Furthermore, we explore routes towards extending EFM as a means of non-invasively probing the local electronic density of states of carbon nanotubes.

Original languageEnglish (US)
Pages (from-to)75-80
Number of pages6
JournalMaterials Research Society Symposium Proceedings
Volume1025
StatePublished - Dec 1 2008
Externally publishedYes
EventNanoscale Phenomena in Functional Materials by Scanning Probe Microscopy - Boston, MA, United States
Duration: Nov 26 2007Nov 30 2007

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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