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Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC

  • K. Shibin
  • , G. Auzinger
  • , H. Bakhshiansohi
  • , A. Dabrowski
  • , A. Dierlamm
  • , M. Dragicevic
  • , A. Gholami
  • , G. Gomez
  • , M. Guthoff
  • , M. Haranko
  • , A. Homna
  • , M. Jenihhin
  • , J. Kaplon
  • , O. Karacheban
  • , B. Korcsmáros
  • , A. Lokhovitskiy
  • , R. Loos
  • , S. Mallows
  • , J. Michel
  • , V. Myronenko
  • G. Pásztor, J. Schwandt, M. Sedghi, A. Shevelev, G. Steinbrueck, D. Stickland, G. J. Wegrzyn

Research output: Contribution to journalConference articlepeer-review

Abstract

The high-luminosity upgrade of the LHC (HL-LHC) brings unprecedented requirements for precision bunch-by-bunch luminosity measurement and beam-induced background monitoring in real time. A key component of the CMS Beam Radiation Instrumentation and Luminosity detector system is a stand-alone luminometer, the Fast Beam Condition Monitor (FBCM), which is able to operate independently at all times with a triggerless asynchronous readout. FBCM utilizes a dedicated front-end ASIC to amplify the signals from CO2-cooled silicon-pad sensors with 1 ns timing resolution. Front-end (FE) electronics are subject to high-radiation conditions, thus all components are radiation hardened: sensors, ASICs, transceivers, etc. The FBCM ASIC contains 6 channels, each outputting a high-speed binary signal carrying the time-of-arrival and time-over-threshold information. This signal is sent via a gigabit optical link to the back-end electronics for analysis. A dedicated test system is designed for the FBCM FE electronics with a modular setup for all testing needs of the project from initial ASIC validation test to system-level testing with the full read-out chain. The paper reports on the design, read-out architecture, and testing program for the FBCM electronics.

Original languageEnglish (US)
Article number063
JournalProceedings of Science
Volume468
StatePublished - Jul 16 2025
Event6th International Conference on Technology and Instrumentation in Particle Physics, TIPP 2023 - Cape Town, South Africa
Duration: Sep 4 2023Sep 8 2023

All Science Journal Classification (ASJC) codes

  • General

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