TY - JOUR
T1 - Electron momentum-transfer collision frequency measurements in small plasma objects via coherent microwave scattering
AU - Patel, Adam R.
AU - Wang, Xingxing
AU - Braun, Erik L.
AU - Ranjan, Apoorv
AU - Slipchenko, Mikhail N.
AU - Macheret, Sergey
AU - Shneider, Mikhail N.
AU - Shashurin, Alexey
N1 - Publisher Copyright:
© 2022 IOP Publishing Ltd.
PY - 2023/1
Y1 - 2023/1
N2 - This paper presents the possibility of using coherent microwave scattering (CMS) for temporally resolved measurements of the electron momentum-transfer collision frequency in small plasma objects. Specifically, the electron collision frequency is inferred via phase information from microwave scattering off microplasmas operating in the mixed collisional-Thomson scattering regime. We further suggest the combination of phase and amplitude measurements to derive total electron counts and temperatures in small plasmas. An experimental validation of this concept is performed by 10.5 GHz CMS off laser-induced, variable-pressure oxygen and air plasmas.
AB - This paper presents the possibility of using coherent microwave scattering (CMS) for temporally resolved measurements of the electron momentum-transfer collision frequency in small plasma objects. Specifically, the electron collision frequency is inferred via phase information from microwave scattering off microplasmas operating in the mixed collisional-Thomson scattering regime. We further suggest the combination of phase and amplitude measurements to derive total electron counts and temperatures in small plasmas. An experimental validation of this concept is performed by 10.5 GHz CMS off laser-induced, variable-pressure oxygen and air plasmas.
KW - constructive coherent microwave scattering
KW - electron collision frequency
KW - microwave plasma diagnostics
KW - nonintrusive plasma diagnostics
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U2 - 10.1088/1361-6595/aca430
DO - 10.1088/1361-6595/aca430
M3 - Article
AN - SCOPUS:85144263294
SN - 0963-0252
VL - 31
JO - Plasma Sources Science and Technology
JF - Plasma Sources Science and Technology
IS - 11
M1 - 114011
ER -