TY - JOUR
T1 - Electron interferometer formed with a scanning probe tip and quantum point contact
AU - Jura, M. P.
AU - Topinka, M. A.
AU - Grobis, M.
AU - Pfeiffer, L. N.
AU - West, K. W.
AU - Goldhaber-Gordon, D.
PY - 2009/8/6
Y1 - 2009/8/6
N2 - We show an electron interferometer between a quantum point contact (QPC) and a scanning gate microscope (SGM) tip in a two-dimensional electron gas. The QPC and SGM tip act as reflective barriers of a lossy cavity; the conductance through the system thus varies as a function of the distance between the QPC and SGM tip. We characterize how temperature, electron wavelength, cavity length, and reflectivity of the QPC barrier affect the interferometer. We report checkerboard interference patterns near the QPC and, when injecting electrons above or below the Fermi energy, effects of dephasing.
AB - We show an electron interferometer between a quantum point contact (QPC) and a scanning gate microscope (SGM) tip in a two-dimensional electron gas. The QPC and SGM tip act as reflective barriers of a lossy cavity; the conductance through the system thus varies as a function of the distance between the QPC and SGM tip. We characterize how temperature, electron wavelength, cavity length, and reflectivity of the QPC barrier affect the interferometer. We report checkerboard interference patterns near the QPC and, when injecting electrons above or below the Fermi energy, effects of dephasing.
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U2 - 10.1103/PhysRevB.80.041303
DO - 10.1103/PhysRevB.80.041303
M3 - Article
AN - SCOPUS:68949121132
SN - 1098-0121
VL - 80
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 4
M1 - 041303
ER -