Electron interferometer formed with a scanning probe tip and quantum point contact

M. P. Jura, M. A. Topinka, M. Grobis, L. N. Pfeiffer, K. W. West, D. Goldhaber-Gordon

Research output: Contribution to journalArticlepeer-review

50 Scopus citations


We show an electron interferometer between a quantum point contact (QPC) and a scanning gate microscope (SGM) tip in a two-dimensional electron gas. The QPC and SGM tip act as reflective barriers of a lossy cavity; the conductance through the system thus varies as a function of the distance between the QPC and SGM tip. We characterize how temperature, electron wavelength, cavity length, and reflectivity of the QPC barrier affect the interferometer. We report checkerboard interference patterns near the QPC and, when injecting electrons above or below the Fermi energy, effects of dephasing.

Original languageEnglish (US)
Article number041303
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number4
StatePublished - Aug 6 2009
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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