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Electron diffraction conditions and surface imaging in reflection electron microscopy
Nan Yao
, J. M. Cowley
Research output
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Contribution to journal
›
Article
›
peer-review
9
Scopus citations
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Dive into the research topics of 'Electron diffraction conditions and surface imaging in reflection electron microscopy'. Together they form a unique fingerprint.
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Engineering & Materials Science
Atoms
15%
Diffraction
16%
Electron diffraction
100%
Electron microscopy
97%
Electron scattering
27%
Imaging techniques
57%
Inelastic scattering
28%
Reflection high energy electron diffraction
31%
Scattering
14%
Surface structure
18%
Chemical Compounds
Electron Diffraction
77%
Electron Microscopy
65%
Electron Scattering
29%
Reflection
60%
Reflectivity
21%
Resonance
45%
Surface
24%
Surface Structure
18%
Physics & Astronomy
atoms
6%
augmentation
15%
diffraction
6%
electron diffraction
64%
electron microscopy
65%
electron scattering
11%
image contrast
14%
inelastic scattering
11%
reflectance
8%
scattering
6%